Materials Testing

Materials' testing under the (light-) microscope is a well established extension to classical testing methods. It is one of our specialties to make testing instrumentation available that will work in:

  • Scanning electron microscopy,
  • Atomic force microscopy (AFM),
  • We also create instrumentation for
    FIB (Focused Ion Beam) users

to obtain microscopic in-situ observations under

  • Tensile-compression-, bending- or torsion load. Last not least:
  • to combine these tests with heating and/or cooling ...

... and always create new instrumentation according to your needs.

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