Materials' testing under the (light-) microscope is a well established extension to classical testing methods. It is one of our specialties to make testing instrumentation available that will work in:

• Scanning electron microscopy,
• Atomic force microscopy (AFM),
• We also create instrumentation for
  FIB (Focused Ion Beam) users

to obtain microscopic in-situ observations under

• Tensile-compression-, bending- or torsion load. Last not least:
• to combine these tests with heating and/or cooling ...

... and always create new instrumentation according to your needs.