Quality Made in Germany since 1995

Quality Made in Germany since 1995

Bending modules

Bending Systems for In-Situ experiments in SEM, REM, Light Microscopy and Gloveboxes

Bending modules 200N top-/sideview

  • Deformation device, suitable for work under vacuum in the scanning electron microscope.
  • Continuously adjustable speed range from 0.2 -20 μm/sec.
  •  It allows 3-point or 4-point bending tests.
  • Optional expandable to 500N.

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Bending modules 5kN sideview

  • Deformation device,customized for use under the Atomic Force microscope.
  • Suitable for work under vacuum in the scanning electron microscope.
  • Display of specimens in sectional view or top view. adjustable speed range from 2 to 150 μm/sec.
  •  It allows 3-point or 4-point bending.

Datenblatt Download

Bending modules 5kN topview

  • Deformation device,customized for use under the Atomic Force microscope.
  • Suitable for work under vacuum in the scanning electron microscope and light microscope.
  • Display of specimens in top view. adjustable speed range from 0,2 to 150 μm/sec.
  •  It allows 3-point or 4-point bending.

Datenblatt Download

Kipp-Biegemodul 200N

  • For compression experiments
  • Low and high forces
  • Holder to be used in the tensile module as an exchangeable compression device. Suitable for X-ray applications

Datenblatt Download

Bending module 200N

  • Deformation device, suitable for work under vacuum in the scanning electron microscope.
  • Continuously adjustable speed range from 0.2 -20 μm/sec.
  • It allows 3-point or 4-point bending tests.
  • Optional expandable to 500N.

Datenblatt Download

Bending module 5kN sideview

  • Deformation device,customized for use under the Atomic Force microscope.
  • Suitable for work under vacuum in the scanning electron microscope.
  • Display of specimens in sectional view or top view. adjustable speed range from 2 to 150 μm/sec.
  •  It allows 3-point or 4-point bending.

Datenblatt Download

Bending module 5kN topview

  • Deformation device,customized for use under the Atomic Force microscope.
  • Suitable for work under vacuum in the scanning electron microscope and light microscope.
  • Display of specimens in top view. adjustable speed range from 0,2 to 20 μm/sec.
  •  It allows 3-point or 4-point bending.

Datenblatt Download

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