![]() |
![]() |
|
|||||||
Bending Module 200 N
|
Bending Module 200 N
"Top & Side" - 200 N Bending Module for 3- and 4-Point Bending Experiments
The "electron beam" symbolizes the microscope's viewing direction - regardless if a light microscope, an AFM, or an ultrasonic microscope (SAM, and ELSAM) is used. The latter two usually work at very short working distances. Therefore the designer made sure that there is enough clearance near the specimen for good access - from the top and from the side.
Specifications
Bending Module for 3- and 4-Point-Bending Experiments, 200 N
This device is a member of a "family" of testing attachments which may all run from the same controller. This multi-purpose testing device allows viewing the specimen's top and side. The specimen may stay inside the device without changing the applied load, when changing the viewing direction, or taking it to a different microscope.
Applications
Static or dynamic observations of surface changes under controlled mechanical load, crack growth, delaminating phenomenae, formation of glide planes etc.
Metals, ceramics, glass, ceramic bulk materials or layers, galvanic coatings, soldered or welded joints, minerals, wood, organic materials. This materials testing, device fits most of today's SEM specimen stages. Three small standoffs allow to place it under a light microscope. It was designed primarily for the use under a Nanoscope III, but small attachments allow the use of stand-alone AFMs. There is also enough clearance for experiments under a scanning acoustic microscope (SAM).
Performance
Controllers
Choice between manual controller (with "Supermouse"), and microprocessor with interface and software for PC-operation. Return set to manufacturer for later change or addition of the controller.
|
![]() Pic.1: The beam is looking at the top surface of the specimen ![]() Pic.2: The beam is looking at the cut surface of the specimen |
|||||||